As device operating frequencies increase, the demand for reliable, production-worthy, high-frequency contactors is also increasing. High bandwidth has historically been the standard by which frequency performance is measured, and has typically been achieved by making the path through the contactor as short as possible, keeping it to a fraction of the shortest wavelength.
Another issue impacting contacting performance is the increase in functionality of devices. Many large SoC, SiP, and FPGA devices have ground configurations that are less than ideal for RF performance. In these cases isolation and return loss performance can be as important and in some cases more important than bandwidth. Inquiries regarding these parameters are being addressed more frequently.
In many cases the best solution to address all these issues is co-axial contact. A well-designed co-axial approach can improve return loss by better matching the characteristic impedance, provides excellent isolation, and maintains or improved bandwidth.
This presentation will briefly describe the history of performance improvements with various technologies, describe the advantages of co-axial contactors, compare full co-axial with partial co-axial, and compare co-axial performance to other methods of achieving high RF performance. User feedback comparing a full co-axial solution to a competitive solution will be included.