High volume production test of RF Wireless devices is dominated today by devices which are utilized primarily in the Connectivity and Mobility markets. This invited paper addresses some of the challenges faced by the ATE equipment when testing some of these RF devices.
RF Wireless systems strive to transmit more data in a given bandwidth by employing much more complex modulation schemes. As these schemes have evolved over the years from QPSK through to 256-QAM, now 1024 QAM and possibly 4096 QAM in the future, the added complexity drives the need for an ATE system to provide lower Error Vector Magnitude metrics. EVM results are presented here for an RF system loopback over a 20db level range for the 802.11ac 1024 QAM (4096 QAM) case.
Two emerging RF Wireless markets “IoT – Internet of things” and 802.11ad which will drive future test volumes are also discussed.