Legislation to reduce car injuries is causing dramatic growth in ADAS (Advanced Driver Assistance Systems). Radar-based ADAS are moving from 24GHz to 77GHz, providing better range, bandwidth and resolution for detecting objects. Automotive 0 ppm failure rates necessitate full functional test of the ADAS ICs at 24GHz or 77 GHz in both Engineering and HVM.
Specialized ATE solution may be under-utilized as requirements change are not well adapted for HVM. An ideal solution should be usable with different RF and Automotive applications.
A co-development between ST and Xcerra has already implemented 25GHz RF test to maintain the highest quality levels. This is based on a flexible test call base that can be used for other requirements and a system-level solution to maximize OEE and minimize cost. The test cell is now being extended to provide a 77GHz test solution.
The DUT has 38GHz IF and several 77GHz TxRx to implement a multiple beam solution for best performance. The device also uses >1 gigabit serial I/O facilitate high speed data transfer.
The test cell uses a low-cost 6GHz subsystem and optional radar frequency test modules to balance flexibility and cost of full-speed test.
An integrated test cell design of the complete signal path, from RF instrumentation, through the fixture and contactor to the DUT, is used to maintain 77GHz signal quality. Production contactors are required for WLCSP and packaged devices. In-socket calibration verifies signal performance at the DUT.
Because automotive ICs operate at extended hot and cold temperatures, a “tri-temp” handler ensures the highest test coverage. A systems-level mechanical design enables temperature accuracy of +/-2 °C.
In conclusion, the customer’s DUT is tested to the highest levels of coverage, to guarantee quality at the OEMs. The vendor has proven an optimized test cell approach to provide a cost-effective solution with the highest OEE.