Wireless IoT semiconductor devices present cost driven economies to the market far different than present day wireless designs. A new approach to IoT wireless test will be required to achieve the economies of scale in this market. We start by changing methodologies with unconventional schools of thought while obtaining the same result. Device standards require identical outcomes but how we achieve those results will transform test.
Today, RF wireless PHY testing requires a connection to the device using an RF instrument for source and measure. The RF and Power VI pins are the most expensive resources in a test system due to the nature of test requirements for these resources. Targeting this type of resource in a conventional format will not allow device manufactures to achieve profit margins large enough to make this growth market realize its full potential.
This presentation explores changes in mind set required to think outside the box, attack the technical challenges and drive a new test paradigm for IoT device technologies. We will describe our current assumptions, understand the trade-offs and finally look at varying strategies.