As has been pointed out by various presenters at BiTS, there is no one consistent method for measuring, determining, and specifying Current Carrying Capacity (CCC) in test socket interconnects. This presentation will review existing test methods and compare advantages and disadvantages of each method.
The bulk of the focus will be on a detailed comparison of the thermocouple-based T-rise method vs. the force relaxation method (ISMI). Data will be presented using both methods on the same spring probe contact system and compared. Data should support one of these methods as a best practice. Other methods, such as infrared imaging, will briefly be discussed as well.
I hope the talk will stimulate a technical discussion, and ultimately move to a consensus in the socket manufacturer and socket user community in the way CCC is tested and specified.